UV-NIR Beam Profiler
Near Field Tool
Scientific Solution - Near Field Measurement

CINOGY Technologies near field beam profiling option is suitable for focus spot measurements and near field imaging of fiber ends or output surfaces from laser diodes over a wide wavelength range. The set-up based on the compact CinCam CMOS models and can be assembled with different microscope objectives. These calibrated microscope objectives assured maximum accuracy and enables imaging of small beam structures on the diffraction limit.
제조사 Cinogy
가격 TBD
문의 02-3461-1103
제품 특징

Scientific Solution - Near Field Measurement

CINOGY Technologies near field beam profiling option is suitable for focus spot measurements and near field imaging of fiber ends or output surfaces from laser diodes over a wide wavelength range. The set-up based on the compact CinCam CMOS models and can be assembled with different microscope objectives. These calibrated microscope objectives assured maximum accuracy and enables imaging of small beam structures on the diffraction limit.

Magnification:

 

4x (calibrated)

10x (calibrated)

20x (calibrated)

40x (calibrated)

Spectral response (+NIR / IR Option):

 

320-1150nm 

320-1150nm 

320-1150nm 

320-1150nm 

Data output:

 

8Bit / 10Bit

8Bit / 10Bit

8Bit / 10Bit

8Bit / 10Bit

Numerical aperture (NA):

 

0.1

0.25

0.4

0.65

Working distance (WD):

 

15.8mm

6.4mm

0.8mm

0.6mm

Focal length:

 

29.8mm

17.19mm

8.33mm

4.03mm

Optical resolution:

 

~2µm

~1.5µm

~1.2µm

~1.0µm

Accuracy:

 

Beam size <2%

Beam size <2%

Beam size <2%

Beam size <2%

Beam profiler:

 

CinCam CMOS / CinCam CMOS Nano

Input power (max):

 

100mW@4x, 10x / 10mW@20x, 40x / 1320nm and 1550nm on request

NIR Option: Residual Silicon Response (1320nm) / IR Option: 1470-1605nm

3D Beam Profile
Near Field Beam Profiler